Please use this identifier to cite or link to this item:
http://tailieuso.udn.vn/handle/TTHL_125/10318
Title: | A study of the curvature of a thick ALN film grown on a trench-patterned α-Al2O3 template using X-ray diffraction |
Authors: | Dinh, Thanh Khan Nguyen, Quy Tuan |
Keywords: | Curvature X-ray diffraction AIN film Trench-patterned template Strain |
Issue Date: | 2015 |
Publisher: | The University of Da Nang |
Description: | The University of Danang, Journal of Science and Technology, No.12(97). 2015, Vol.1; PP. 30 – 32. |
URI: | http://tailieuso.udn.vn/handle/TTHL_125/10318 |
ISSN: | 1859 - 1531 |
Appears in Collections: | 2015 |
Files in This Item:
File | Description | Size | Format | |
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AStudyOfTheCurvature.TT.pdf | Abstract | 46.6 kB | Adobe PDF | View/Open |
AStudyOfTheCurvature.TV.pdf | Contents | 284.22 kB | Adobe PDF | View/Open Request a copy |
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