Please use this identifier to cite or link to this item: http://tailieuso.udn.vn/handle/TTHL_125/9413
Full metadata record
DC FieldValueLanguage
dc.contributor.authorGreen, Robert E., Jr., editor-
dc.contributor.authorKishi, Teruo, editor-
dc.contributor.authorSaito, Tetsuya, editor-
dc.contributor.authorTakeda, Nobuo, editor-
dc.contributor.authorDjordjevic, B. Boro, editor-
dc.date.accessioned2018-12-11T07:49:40Z-
dc.date.available2018-12-11T07:49:40Z-
dc.date.issued2001-
dc.identifier.isbn0080437990-
dc.identifier.urihttp://tailieuso.udn.vn/handle/TTHL_125/9413-
dc.descriptionIncludes bibliographical references and indexes; xii, 421 pages, ill.en
dc.description.tableofcontentsInvited papers; Composites; Electromagnetics and radiography; ...en
dc.language.isoenen
dc.publisherAmsterdam ; New York : Elsevieren
dc.subjectNondestructive testing -- Congressesen
dc.subjectMaterials -- Testing -- Congressesen
dc.titleNondestructive Characterization of Materials X: Proceedings of the 10th International Symposium on Nondestructive Characterization of Materials™, 26-30 June 2000, Karuizawa, Japanen
dc.typeBooken
Appears in Collections:6.Công nghệ

Files in This Item:
File Description SizeFormat 
NondestructiveCharacterizationOfMaterialsX.TT.pdfTable of Contents973.36 kBAdobe PDFView/Open
NondestructiveCharacterizationOfMaterialsX.TV.pdfContents19.74 MBAdobe PDFView/Open    Request a copy


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.