Please use this identifier to cite or link to this item: http://tailieuso.udn.vn/handle/TTHL_125/9289
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dc.contributor.authorGarrett, Patrick H.-
dc.date.accessioned2018-11-15T06:50:33Z-
dc.date.available2018-11-15T06:50:33Z-
dc.date.issued2002-
dc.identifier.isbn0471205060-
dc.identifier.urihttp://tailieuso.udn.vn/handle/TTHL_125/9289-
dc.descriptionIncludes bibliographical references and index; x, 213 pages, ill.en
dc.description.tableofcontents1. Process, quantum, and analytical sensors; 2. Instrumentation amplifiers and parameter errors; 3. Active filter design with nominal error; ...en
dc.language.isoenen
dc.publisherNew York : John Wiley & Sonsen
dc.subjectElectrooptical devices--Testing--Congressesen
dc.subjectAutomatic checkout equipment--Congressesen
dc.titleMultisensor Instrumentation 6σ Design: Defined Accuracy Computer-Integrated Measurement Systemsen
dc.typeBooken
Appears in Collections:6.Công nghệ

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